Effets singuliers des rayonnements cosmiques et atmospheriques sur les composants mémoires

par Alexandre Bosser

Projet de thèse en SYAM - Systèmes Automatiques et Micro-Électroniques

Sous la direction de Luigi Dilillo et de Ari Virtanen.

Thèses en préparation à Montpellier en cotutelle avec l'Universite de Jyvaskyla , dans le cadre de I2S - Information, Structures, Systèmes , en partenariat avec LIRMM - Laboratoire d'Informatique, de Robotique et de Micro-électronique de Montpellier (laboratoire) et de Département Microélectronique (equipe de recherche) depuis le 28-05-2015 .


  • Résumé

    The present work focuses on SEE testing of memory components. It presents the requirements, difficulties and shortcomings of radiation testing, and proposes methods for radiation test data processing; the detection and study of failure modes is used to gain insight on the tested components. This study is based on data obtained over four years on several irradiation campaigns, where memory devices of different technologies (static RAMs, ferroelectric RAM, magnetoresistive RAM, and flash) were irradiated with proton, heavy-ion, neutron and muon beams. The yielded data also supported the development of MTCube, a CubeSat picosatellite developed jointly by the Centre Spatial Universitaire (CSU) and LIRMM in Montpellier, whose mission is to carry out in-flight testing on the same memory devices. The underlying concepts regarding radiation, radiation environments, radiation-matter interactions, memory component architecture and radiation testing will be introduced in the first chapters, while the academic advances which were made during this study are presented in the final chapter.

  • Titre traduit

    Single-event effects from space and atmospheric radiation in memory components


  • Résumé

    The present work focuses on SEE testing of memory components. It presents the requirements, difficulties and shortcomings of radiation testing, and proposes methods for radiation test data processing; the detection and study of failure modes is used to gain insight on the tested components. This study is based on data obtained over four years on several irradiation campaigns, where memory devices of different technologies (static RAMs, ferroelectric RAM, magnetoresistive RAM, and flash) were irradiated with proton, heavy-ion, neutron and muon beams. The yielded data also supported the development of MTCube, a CubeSat picosatellite developed jointly by the Centre Spatial Universitaire (CSU) and LIRMM in Montpellier, whose mission is to carry out in-flight testing on the same memory devices. The underlying concepts regarding radiation, radiation environments, radiation-matter interactions, memory component architecture and radiation testing will be introduced in the first chapters, while the academic advances which were made during this study are presented in the final chapter.